Applied Materials has launched the SEMVision™ H20, a new defect review system designed to enhance the analysis of nanoscale defects in advanced semiconductor chips. This system utilizes cutting-edge ...
Silicon Defects are extremely expensive! The cost of quality is very high in an ASIC company. Finding and correcting defects is one of the most expensive part of an ASIC development process. This cost ...
SEMVision™ H20 enables better and faster analysis of nanoscale defects in leading-edge chips Second-generation “cold field emission” technology provides high-resolution imaging AI image recognition ...
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